Surface Analysis

With the help of an extensive range of highly sensitive surface analysis equipment and specialists with years of interdisciplinary experience, we provide our customers with expert advice and solve even the most difficult problems.
Typical questions

Typical questions

The range of questions is virtually unlimited. It includes, among other things

  • Determination of surface composition: qualitative and quantitative
  • Fault analysis: e.g., causes and depths of scratches, delamination, discoloration, and glass defects such as streaks, knots, segregation, crystals, and others
  • Contamination: organic or inorganic
  • Layer analysis: layer thicknesses and composition
  • Particle analysis: size distribution and composition
  • Diffusion processes: leaching or enrichment at an interface or surface
  • Topography: roughness and morphology
  • Structural analysis: qualitative analysis of changes in the structural properties or processing conditions of organic and inorganic materials
  • Temperature-dependent surface analytics
  • Glass thickness variations and changes in optical path length in glasses
  • And much more

Our analyses are not limited to surfaces. Using suitable preparation methods such as polishing, breaking, etching, and ion sputtering, we bring almost all areas of interest to the surface.

Methods in detail

Methods in detail

Time-of-flight secondary ion mass spectrometry (ToF-SIMS)

<h3>Time-of-flight secondary ion mass spectrometry (ToF-SIMS)</h3>
View inside the ToF-SIMS during analysis of a syringe outer surface

Procedures

In this process, a focused ion beam is accelerated onto the sample surface. The mass of the secondary ions generated by this process is then determined using the time-of-flight principle. This method is extremely powerful for trace analysis and qualitative determination of compositions. 

Applications

  • Detection of trace elements or sub-monolayers
  • Parallel detection and analysis of all elements of the periodic table as well as organic signals
  • Spatially resolved imaging (<100 nm)
  • Depth profiles (depth resolution in the nm range)
  • 3D images of all signals

Raman spectrometry

<h3>Raman spectrometry</h3>
Chemical mapping of a glass strip using Raman microscopy. (top left) The region of interest (ROI) is selected in the light microscope image. (bottom left) The Raman map of the ROI shows the distribution of the material components (right) determined by multivariate analysis.

Procedures

In Raman spectrometry, the compounds (molecules or crystals) on or in a surface are excited by a laser and begin to vibrate. Hereby, the laser light emits energy, causing its wavelength to change depending on the type of molecular or crystal bond. The resulting spectrum is compared with databases to identify the analyzed material.
Not only the type of material influences the change in wavelengths, but also how the material is present: For example, the vibrations of the compounds – and thus the change in laser wavelength – can also change slightly if, for example, the material is under tension or the chemistry of the material changes slightly. Process parameters such as temperature or time can also influence molecular vibration. 

Applications

  • Material identification
  • Structural analysis

Optimization of cleaning processes

<h3>Optimization of cleaning processes</h3>
Inspection of an uncleaned and cleaned sample in direct comparison

Procedures

Surfaces often have very narrow process tolerances regarding their surface cleanliness. It is not only necessary to find a process to clean a surface in accordance with the specifications. The cleaning process must also not excessively alter the surface properties (topography or chemistry). Various ultrasonic baths are available for process optimization, in which the cleaner, frequency, temperature, and cleaning duration can be varied and optimized. Synergy with surface analytics leads to efficient optimization of cleaning processes. 

Applications

  • Process optimization in industrial environments
  • Transfer to production
  • Consulting on the purchase of industrial equipment
  • Coating processes
  • Adhesive processes
  • Optical or pharmaceutical applications
List of our methods

Our methods of surface analysis

  • Secondary ion mass spectrometry (ToF-SIMS) (accredited)
  • Raman spectrometry (accredited)
  • Electron microscopy with X-ray detector (SEM/EDX) (accredited)
  • White light interference microscopy (WLI) (accredited)
  • Atomic force microscopy (AFM)
  • Laser interferometry (accredited)
  • Light microscopy (accredited)
  • Automated light microscopy with AI-based evaluation software
  • ATR/IR spectrometry (accredited)
  • Laser-induced breakdown spectroscopy (LIBS)
  • Particle counter
  • Brillouin spectrometry
     
Highlights
Procedure

Contact our experts

Whether you want to develop innovative products or ensure compliance with regulations in regulated industries, the expertise of the accredited SCHOTT laboratory ensures your success through measurable excellence.
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