Technical Details of SCHOTT® low-loss

SCHOTT® low-loss glass is a borosilicate glass with exceptional properties, tailored for high-frequency applications. With a low dielectric constant, minimal dielectric loss, and a CTE matched to the semiconductor industry, it offers an advanced substrate material ideal for high technologies. Designed to enhance RF communication and sensing applications, it is an attractive alternative to existing high-frequency substrates. Currently available as R&D material, it is set to revolutionize the field, offering a broad thickness range and superior surface quality.

Excellent dielectric properties for radio-frequency communication and sensing applications

Low dielectric constant

With a dielectric constant (Dk) of 4.0, SCHOTT® low-loss glass enables high-performance broadband antenna designs. It supports efficient signal propagation and minimizes signal delay, properties that are crucial for advanced telecommunication and radar systems.

Low dielectric loss

SCHOTT® low-loss glass features the lowest dielectric loss within our material range, ensuring highly efficient signal transmission with minimal attenuation. This property is critical for high-frequency applications, where maintaining signal integrity is paramount.

Smooth surface

With a roughness of Ra < 5 nm, SCHOTT® low-loss glass boasts an exceptionally pristine surface. Combined with metallization solutions, it enables the design of RF lines with minimal scattering losses, improving overall performance in high-frequency applications.

Optimized CTE for semiconductors

The coefficient of thermal expansion (CTE) of SCHOTT® low-loss glass is precisely matched to that of silicon wafers (α [10–6 K–1] = 3.29). Its compatibility ensures seamless integration with semiconductor components, enhancing the stability and reliability of electronic devices.
General Properties
Density ρ [g/cm³] 2.14

 

Thermal properties
Thermal expansion coefficient α [10-6 K-1] 3.29
Thermal conductivity λ(25 °C) [W/(m·K)] t.b.d.
Specific heat capacity Cp(20 °C; 100 °C) [J/K]
t.b.d.
Transformation temperature Tg [°C] 467
Strain point at 1014.5 dPas [°C] 548
Annealing point at 1013 dPas [°C]
538 
Softening point at 107.6 dPas [°C]
750
Working point at 104 dPas [°C]

1143

 

Electrical properties

Frequency

f [GHz]

Dielectric constant 

ε ± 0.1 / measured

Tangent delta tan δ

± 0.0005 / measured

1 4.05 0.0011
2 4.05
0.0013
2.45 4.05
0.0014
5 4.05 0.0017
10 4.05 0.0021
15 4.05
0.0024
24 4.05
0.0028
77 4.05
0.0047
110 4.05
0.0061
Log10 Electric volume resistivity ρ [Ω·cm]
T = 250 °C 10.7
 

T = 350 °C

8.8
 
TK100 [°C]
405  

 

Mechanical Properties
Young’s Modulus E [GPa] 51
Poisson’s ratio ν 0.223
Shear Modulus G [GPa]
21
Vicker Hardness [HV]
t.b.d.
Martens Hardness [HM]
t.b.d.
Knoop Hardness
t.b.d.

 

Optical properties
Photo-elastic constant C [nm/(cm MPa)] t.b.d.
Transmittance t.b.d.

 

Chemical durability of raw glass
Hydrolytic resistance acc. to DIN ISO 719  
Hydrolytic Class HGB 1
Acid resistance acc. to DIN 12116
 
Acid class
S1W
Alkali resistance acc. to DIN ISO 695
 
Alkali class
A3

 

Refractive Index

Graph showing the refractive index of SCHOTT® low-loss glass

Dielectric loss

Graph showing the dielectric loss of SCHOTT® low-loss glass

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